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Reflectivity-E (RE) represents the
fraction of the incident radiation that is reflected at the interface of a sample.
Its expression does not take into account for multiple reflections or interference
effects and depends only on the dielectric functions of the incident medium
Ei and of the material Eo.
Function signature : Reflectivity-E(x,Ei,Eo)
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Formula |
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Reflectivity-N (RN) represents the
fraction of the incident radiation that is reflected at the interface of a sample.
Its expression does not take into account for multiple reflections or interference
effects and depends only on the complex refractive indexes of the incident medium
Ni and of the material No.
Function signature : Reflectivity-N(x,Ni,No)
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Formula |
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Reflectance-E (RE) represents the
fraction of the incident radiation that is reflected by a sample with a plate shape.
Its expression take into account for multiple reflections (no interference
effects) and depends on the dielectric functions of the incident medium
Ei, those of the material Eo and the
thickness d of the sample.
Function signature : Reflectance-E(x,Ei,Eo,Thickness)
Units
The spectral dependance must be expressed in wave numbers (cm-1) and
the thickness in (cm).
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Reflectance-N (RN) represents the
fraction of the incident radiation that is reflected by a sample with a plate shape.
Its expression take into account for multiple reflections (no interference
effects) and depends on the complex refractive indexes of the incident medium
Ni, those of the material No and the
thickness d of the sample.
Function signature : Reflectance-N(x,Ni,No,Thickness)
Units
The spectral dependance must be expressed in wave numbers (cm-1) and
the thickness in (cm).
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Reflectance-E-IE (RE) represents the
fraction of the incident radiation that is reflected by a sample with a plate shape.
Its expression take into account for multiple reflections, interference
effects and depends on the dielectric functions of the incident medium
Ei, those of the material Eo and the
thickness d of the sample.
Function signature : Reflectance-E-IE(x,Ei,Eo,Thickness)
Units
The spectral dependance must be expressed in wave numbers (cm-1) and
the thickness in (cm).
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Reflectance-N-IE (RN) represents the
fraction of the incident radiation that is reflected by a sample with a plate shape.
Its expression take into account for multiple reflections, interference
effects and depends on the complex refractive indexes of the incident medium
Ni, those of the material No and the
thickness d of the sample.
Function signature : Reflectance-N-IE(x,Ni,No,Thickness)
Units
The spectral dependance must be expressed in wave numbers (cm-1) and
the thickness in (cm).
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Reflectance-E-PCIE (RE) represents the
fraction of the incident radiation that is reflected by a sample with a plate shape.
Its expression take into account for multiple reflections and interference
effects whose coherence is partial or changes with the frequency. Its expression
depends on the dielectric functions of the incident medium
Ei, those of the material Eo, the
thickness d of the sample and a function f that represents the
coherence.
Function signature :
Reflectance-E-PCIE(x,Ei,Eo,Thickness,Coherence)
Units
The spectral dependance must be expressed in wave numbers (cm-1) and
the thickness in (cm).
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Formula |
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Reflectance-N-PCIE (RN) represents the
fraction of the incident radiation that is reflected by a sample with a plate shape.
Its expression take into account for multiple reflections and interference
effects whose coherence is partial or changes with the frequency. Its expression
depends on the complex refractive indexes of the incident medium
Ni, those of the material No, the
thickness d of the sample and a function f that represents the
coherence.
Function signature : Reflectance-N-PCIE(x,Ni,No,Thickness,Coherence)
Units
The spectral dependance must be expressed in wave numbers (cm-1) and
the thickness in (cm).
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Formula |
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