|
Emittance-WN |
Handbook of OSML Libraries |
|
|
|
|
E - dielectric function
N - complex refractive index
RT - reflectivity, layer transmissivity
WN - wave number
|
OSML Source :
[Emitttance-WN] | |
File Signature :
DB353087 C4DE8998 4573CBA5
31118C6 B86F3E92 5B509C30 584916FB 7304953C | |
Function Group :
[Optical Functions] | |
|
Emittance-E (AE) represents the
fraction of the incident radiation that is absorbed (Kirchhoff law) by a sample
with a plate shape. Its expression take into account for multiple reflections
(no interference effects) and depends on the dielectric functions of the incident
medium Ei, those of the material Eo and the
thickness d of the sample.
Function signature : Emittance-E(x,Ei,Eo,Thickness)
Units
The spectral dependance must be expressed in wave numbers (cm-1) and
the thickness in (cm).
|
|
|
Emittance-N (AN) represents the
fraction of the incident radiation that is absorbed (Kirchhoff law) by a sample
with a plate shape.
Its expression take into account for multiple reflections (no interference
effects) and depends on the complex refractive indexes of the incident medium
Ni, those of the material No and the
thickness d of the sample.
Function signature : Emittance-N(x,Ni,No,Thickness)
Units
The spectral dependance must be expressed in wave numbers (cm-1) and
the thickness in (cm).
|
|
|
Emittance-RT (ART) represents the
fraction of the incident radiation that is absorbed (Kirchhoff law) by a sample
with a plate shape.
Its expression take into account for multiple reflections (no interference
effects and depends on the reflectivity R and the layer transmissivity
T of the sample.
Function signature : Emittance-RT(R,T)
|
Formula |
|
|
|
Planck-WN (PWN) is the wave number
version of the Planck function.
Its expression depends on the temperature T.
Function signature : Planck-WN(x,T)
Constants : C1=1.1910 10-6 (W.m2)
C2=1.4388 (cm.K)
|
|
Formula |
|
|
